To determine the thickness of a thin paper by interference of light in a wedge shaped film.
To determine the thickness of a thin paper by interference of light in a wedge shaped film.
To determine the thickness of a thin paper
by interference of light in a wedge shaped film.
Setup Consist of:
Microscope: Newton's Travelling microscope
arrangement to observe fringes
Light Source: 35 Watt Sodium vapour lamp
housed in powder coated Steel cabinet with
Transformer & Stand
Two optically plane glass plates
For more details please refer datasheet.
To determine the thickness of a thin paper
by interference of light in a wedge shaped film.
Setup Consist of:
Microscope: Newton's Travelling microscope
arrangement to observe fringes
Light Source: 35 Watt Sodium vapour lamp
housed in powder coated Steel cabinet with
Transformer & Stand
Two optically plane glass plates
For more details please refer datasheet.
To determine the modulus of rigidity of the material of the given wire and moment of inertia of an irregular body with the help of a torsion table
High resistance measurement using substitution method has been designed to calculate the value of unknown high resistance by using substitution method.
To calculate the value of Hall coefficient (R), Carrier Density (n) and carrier mobility.
Fourier Analysis Kit is used to Analyse various Complex Signals.